New Approaches for Measuring Electrostatic Potentials and Charge Density Distributions in Working Devices Using Off-Axis and In-Line Electron Holography
نویسندگان
چکیده
1 Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons and Peter Gruenberg Institute, Forschungszentrum Juelich, Juelich, Germany 2 Department of Materials, University of Oxford, Parks Road, Oxford, United Kingdom 3 Fakultaet fuer Physik & Center of Nanointegration, Universitaet Duisburg-Essen, Duisburg, Germany 4 Department of Physics and Astronomy, University of Bologna, Viale B. Pichat 6/2, Bologna, Italy
منابع مشابه
Towards quantitative electrostatic potential mapping of working semiconductor devices using off-axis electron holography.
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تاریخ انتشار 2014